Dynamic Dielectric Properties of Yttrium (Y) Substituted LaCoO3
Abstract
In the present work, samples of La1-xYxCoO3, (x = 0.0, 0.2, 0.4 and 0.6) were prepared by the standard solid state reaction technique. To confirm the crystal structure, X-ray diffraction were performed at room temperature. The Whole Powder Pattern Fitting (WPPF) or Rietveld method is used for La1-xYxCoO3 samples to determine the lattice constant as well as crystal structure. The capacitance, loss tangent, conductivity, resistance and reactance have been measured as a function of frequency in the range from 20 Hz to 10 kHz. The measurement of frequency dependent capacitance shows that the decrease in capacitance and loss tangent are observed with the increase in frequency. Also, the value of capacitance increases and loss tangent decreases with increasing concentration of Yttrium (Y). Also, the Cole-Cole plot shows that the grain and grain boundary resistance decreases, as a result resistivity decreases while conductivity increases with increasing concentration of Y.
